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Characterization of individual interface traps with charge pumping
Publication:
Characterization of individual interface traps with charge pumping
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Saks, N.S.
;
Groeseneken, Guido
;
De Wolf, Ingrid
Journal
Applied Physics Letters
Abstract
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1802
since deposited on 2021-09-29
Acq. date: 2025-12-15
Citations
Metrics
Views
1802
since deposited on 2021-09-29
Acq. date: 2025-12-15
Citations