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Measurement and simulation of statistical variability in FinFETs
Publication:
Measurement and simulation of statistical variability in FinFETs
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mercha, Abdelkarim
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1848
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations
Metrics
Views
1848
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations