Publication:
Solution-Processed Pb(Zr,Ti)O<sub>3</sub> Thin Films with Strong Remnant Pockels Coefficient
| dc.contributor.author | Picavet, Ewout | |
| dc.contributor.author | De Geest, Kobe | |
| dc.contributor.author | Lievens, Enes | |
| dc.contributor.author | Rijckaert, Hannes | |
| dc.contributor.author | Vandekerckhove, Tom | |
| dc.contributor.author | Solano, Eduardo | |
| dc.contributor.author | Deduytsche, Davy | |
| dc.contributor.author | Van Bossele, Laura | |
| dc.contributor.author | Van Thourhout, Dries | |
| dc.contributor.author | De Buysser, Klaartje | |
| dc.contributor.author | Beeckman, Jeroen | |
| dc.contributor.imecauthor | De Geest, Kobe | |
| dc.contributor.imecauthor | Lievens, Enes | |
| dc.contributor.imecauthor | Van Thourhout, Dries | |
| dc.contributor.orcidimec | Van Thourhout, Dries::0000-0003-0111-431X | |
| dc.date.accessioned | 2024-09-23T14:02:54Z | |
| dc.date.available | 2024-08-08T19:57:46Z | |
| dc.date.available | 2024-09-23T14:02:54Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | GIWAXS experiments were recorded at NCD-SWEET beamline at ALBA synchrotron with collaboration of ALBA staff. TEM measurements were performed by Hannes Rijckaert at the UGent TEM Core Facility. E.P. acknowledges support and funding as an SB-PhD Fellow of the Research Foundation-Flanders (FWO, Grant number 3S041219). Electrical characterization was performed by Jiayi Liu. H.R. acknowledges support and funding as postdoctoral fellow fundamental research of the Research Foundation-Flanders (FWO, Grant number 1273621N). This work was financially supported by Special Research Fund - UGent (BOF20/GOA/027) and the Horizon Europe project VISSION (Grant ID: 101070622). | |
| dc.identifier.doi | 10.1021/acsami.4c07073 | |
| dc.identifier.issn | 1944-8244 | |
| dc.identifier.pmid | MEDLINE:39077874 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44285 | |
| dc.publisher | AMER CHEMICAL SOC | |
| dc.source.beginpage | 41134 | |
| dc.source.endpage | 41144 | |
| dc.source.issue | 31 | |
| dc.source.journal | ACS APPLIED MATERIALS & INTERFACES | |
| dc.source.numberofpages | 11 | |
| dc.source.volume | 16 | |
| dc.subject.keywords | LEAD-ZIRCONATE-TITANATE | |
| dc.subject.keywords | SOL-GEL | |
| dc.subject.keywords | FERROELECTRIC-FILMS | |
| dc.subject.keywords | SPUTTERING METHOD | |
| dc.subject.keywords | DEPOSITION | |
| dc.subject.keywords | SPECTRA | |
| dc.subject.keywords | POLARIZATION | |
| dc.subject.keywords | TEMPERATURE | |
| dc.title | Solution-Processed Pb(Zr,Ti)O3 Thin Films with Strong Remnant Pockels Coefficient | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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