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Charge trapping in SiOx/ZrO2 gate dielectric stacks
Publication:
Charge trapping in SiOx/ZrO2 gate dielectric stacks
Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Naili, Mohamed
;
Heyns, Marc
;
Stesmans, Andre
Journal
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1862
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1862
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations