Publication:

Studying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)

Date

2011
Proceedings Paper
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dc.contributor.authorUruena De Castro, Angel
dc.contributor.authorJohn, Joachim
dc.contributor.authorEyben, Pierre
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorWerner, Thilo
dc.contributor.authorHantschel, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorPoortmans, Jef
dc.contributor.authorMertens, Robert
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-19T20:00:53Z
dc.date.available2021-10-19T20:00:53Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19930
dc.source.beginpage1530
dc.source.conference26th European Photovoltaic Solar Energy Conference - EU PVSEC
dc.source.conferencedate5/09/2011
dc.source.conferencelocationHamburg Germany
dc.source.endpage1533
dc.title

Studying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)

dc.typeProceedings paper
dspace.entity.typePublication
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