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Experimental validation of stochastic modeling for negative-tone develop EUV resist
Publication:
Experimental validation of stochastic modeling for negative-tone develop EUV resist
Date
2015
Proceedings Paper
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33315.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kamohara, Itaru
;
Gao, Weimin
;
Klostermann, Ulrich
;
Schmöller, Thomas
;
Demmerle, Wolfgang
;
Lucas, Kevin
;
De Simone, Danilo
;
Hendrickx, Eric
;
Vandenberghe, Geert
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1969
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1969
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations