Publication:
Thin SiGe strain-relaxed buffer layers: relaxation mechanism and integration in strained Si MOS-FETs
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1954 since deposited on 2021-10-16
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Acq. date: 2026-01-25
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1954 since deposited on 2021-10-16
2last month
1last week
Acq. date: 2026-01-25
Citations