Publication:
Measuring on-wafer high-frequency modulation response characteristics of optical transmitters and detectors
Date
| dc.contributor.author | Debie, Peter | |
| dc.contributor.author | Martens, Luc | |
| dc.contributor.imecauthor | Martens, Luc | |
| dc.date.accessioned | 2021-09-29T14:24:52Z | |
| dc.date.available | 2021-09-29T14:24:52Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1184 | |
| dc.source.beginpage | 504 | |
| dc.source.endpage | 510 | |
| dc.source.issue | 2 | |
| dc.source.journal | IEEE Trans. Instrumentation and Measurement | |
| dc.source.volume | 45 | |
| dc.title | Measuring on-wafer high-frequency modulation response characteristics of optical transmitters and detectors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |