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Electrical properties and reliability of ultrathin remote plasma enhanced CVD Si3N4 layers
Publication:
Electrical properties and reliability of ultrathin remote plasma enhanced CVD Si3N4 layers
Date
1999
Presentation
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3482.pdf
185.4 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Degraeve, Robin
;
Pomarede, C.
;
van Dijk, Kitty
;
Werkhoven, Chris
;
Mertens, Paul
;
Heyns, Marc
;
Stesmans, Andre
Journal
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1893
since deposited on 2021-10-06
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Acq. date: 2025-10-24
Citations
Metrics
Views
1893
since deposited on 2021-10-06
405
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations