Publication:

Perspective on III-V Tunnel-FETs: bridging the gap between ideal device design and experimental realizations through calibration

Date

2016
Meeting abstract
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dc.contributor.authorVerhulst, Anne
dc.contributor.authorSmets, Quentin
dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorVerreck, Devin
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorAlian, AliReza
dc.contributor.authorFranco, Jacopo
dc.contributor.authorMols, Yves
dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorLin, Dennis
dc.contributor.authorMocuta, Anda
dc.contributor.authorSoree, Bart
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-23T16:41:29Z
dc.date.available2021-10-23T16:41:29Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27531
dc.source.conference47th IEEE Semiconductor Interface Specialists Conference - SISC
dc.source.conferencedate7/12/2016
dc.source.conferencelocationSan Diego, CA USA
dc.title

Perspective on III-V Tunnel-FETs: bridging the gap between ideal device design and experimental realizations through calibration

dc.typeMeeting abstract
dspace.entity.typePublication
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