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Grain size and orientation in ternary Co1-xNixSi2 thin films on Si(100): Influence of the Ni content

Date

2004
Presentation
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dc.contributor.authorSmeets, D.
dc.contributor.authorDetavernier, C.
dc.contributor.authorBender, Hugo
dc.contributor.authorVantomme, Andre
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVantomme, Andre
dc.date.accessioned2021-10-15T16:18:47Z
dc.date.available2021-10-15T16:18:47Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9611
dc.source.conference2nd International Conference on Textures of Materials - ITAP2
dc.source.conferencedate7/07/2004
dc.source.conferencelocationMetz France
dc.title

Grain size and orientation in ternary Co1-xNixSi2 thin films on Si(100): Influence of the Ni content

dc.typeOral presentation
dspace.entity.typePublication
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