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Statistical Effective Fault Attacks: The Other Side of the Coin

 
dc.contributor.authorVafaei, Navid
dc.contributor.authorZarei, Sara
dc.contributor.authorBagheri, Nasour
dc.contributor.authorEichlseder, Maria
dc.contributor.authorPrimas, Robert
dc.contributor.authorSoleimany, Hadi
dc.date.accessioned2022-06-08T09:22:41Z
dc.date.available2022-06-01T02:19:48Z
dc.date.available2022-06-08T09:22:41Z
dc.date.issued2022
dc.description.wosFundingTextThis work was supported by the European Research Council (ERC) through the European Union's (EU) Horizon 2020 Research and Innovation Program under Grant 681402.
dc.identifier.doi10.1109/TIFS.2022.3172634
dc.identifier.issn1556-6013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39914
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1855
dc.source.endpage1867
dc.source.issuena
dc.source.journalIEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY
dc.source.numberofpages13
dc.source.volume17
dc.title

Statistical Effective Fault Attacks: The Other Side of the Coin

dc.typeJournal article
dspace.entity.typePublication
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