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Modeling and spectroscopy of ovonic threshold switching defects

 
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRavsher, Taras
dc.contributor.authorKabuyanagi, Shoichi
dc.contributor.authorFantini, Andrea
dc.contributor.authorClima, Sergiu
dc.contributor.authorGarbin, Daniele
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorKabuyanagi, Shoichi
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecDegraeve, R.::0000-0002-4609-5573
dc.contributor.orcidimecRavsher, T.::0000-0001-7862-5973
dc.contributor.orcidimecClima, S.::0000-0002-4044-9975
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.date.accessioned2023-08-10T12:31:10Z
dc.date.available2023-06-20T10:37:39Z
dc.date.available2023-08-10T12:31:10Z
dc.date.issued2021
dc.identifier.doi10.1109/IRPS46558.2021.9405114
dc.identifier.eisbn978-1-7281-6893-7
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41982
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 21-24, 2021
dc.source.conferencelocationMonterey
dc.source.journalna
dc.source.numberofpages5
dc.title

Modeling and spectroscopy of ovonic threshold switching defects

dc.typeProceedings paper
dspace.entity.typePublication
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