Publication:
Wafer level characterization and failure analysis of microsensors
Date
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.author | De Coster, Jeroen | |
| dc.contributor.author | Varela Pedreira, Olalla | |
| dc.contributor.author | Haspeslagh, Luc | |
| dc.contributor.author | Witvrouw, Ann | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.imecauthor | De Coster, Jeroen | |
| dc.contributor.imecauthor | Varela Pedreira, Olalla | |
| dc.contributor.imecauthor | Haspeslagh, Luc | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.date.accessioned | 2021-10-17T06:48:38Z | |
| dc.date.available | 2021-10-17T06:48:38Z | |
| dc.date.issued | 2008 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13629 | |
| dc.source.beginpage | 144 | |
| dc.source.conference | 7th IEEE Conference on Sensors | |
| dc.source.conferencedate | 26/10/2008 | |
| dc.source.conferencelocation | Lecce Italy | |
| dc.source.endpage | 147 | |
| dc.title | Wafer level characterization and failure analysis of microsensors | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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