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Conference contributions
Fluctuation scaling in nano-interconnects and its application to electromigration
Publication:
Fluctuation scaling in nano-interconnects and its application to electromigration
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Date
2019
Meeting abstract
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41374.pdf
581.06 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Beyne, Sofie
;
Beyne, Tim
Journal
Abstract
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1994
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations
Metrics
Views
1994
since deposited on 2021-10-27
Acq. date: 2025-12-12
Citations