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Book chapters
Electrical reliability challenges of advanced low-k dielectrics
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Electrical reliability challenges of advanced low-k dielectrics
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Date
2016
Book Chapter
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Chen
;
Li, Yunlong
;
Baklanov, Mikhaïl
;
Croes, Kristof
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1967
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1967
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations