Publication:
Lifetime modeling of intrinsic gate oxide breakdown at high temperature
Date
| dc.contributor.author | Moonen, R. | |
| dc.contributor.author | Vanmeerbeek, P. | |
| dc.contributor.author | Lekens, Geert | |
| dc.contributor.author | De Ceuninck, Ward | |
| dc.contributor.author | Moens, P. | |
| dc.contributor.author | Boutsen, J. | |
| dc.contributor.imecauthor | Lekens, Geert | |
| dc.contributor.imecauthor | De Ceuninck, Ward | |
| dc.date.accessioned | 2021-10-16T18:02:10Z | |
| dc.date.available | 2021-10-16T18:02:10Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12592 | |
| dc.source.beginpage | 1389 | |
| dc.source.endpage | 1393 | |
| dc.source.issue | 9_11 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 47 | |
| dc.title | Lifetime modeling of intrinsic gate oxide breakdown at high temperature | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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