Publication:
Dangling bond defects in silicon-passivated strained-Si1xGex channel layers
Date
| dc.contributor.author | Madia, Oreste | |
| dc.contributor.author | Kepa, Jacek | |
| dc.contributor.author | Afanas'ev, Valeri | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Hikavyy, Andriy | |
| dc.contributor.author | Stesmans, Andre | |
| dc.contributor.imecauthor | Madia, Oreste | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Hikavyy, Andriy | |
| dc.contributor.imecauthor | Stesmans, Andre | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
| dc.date.accessioned | 2021-10-29T00:18:48Z | |
| dc.date.available | 2021-10-29T00:18:48Z | |
| dc.date.issued | 2020 | |
| dc.identifier.issn | 0957-4522 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35520 | |
| dc.identifier.url | https://doi.org/10.1007/s10854-019-01098-2 | |
| dc.source.beginpage | 75 | |
| dc.source.endpage | 79 | |
| dc.source.journal | Journal of Materials Science: Materials in Electronics | |
| dc.source.volume | 31 | |
| dc.title | Dangling bond defects in silicon-passivated strained-Si1xGex channel layers | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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