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Impact of the on-chip and off-chip ESD protection network on transient-induced latchup in CMOS IC
Publication:
Impact of the on-chip and off-chip ESD protection network on transient-induced latchup in CMOS IC
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Date
2013-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scholz, Mirko
;
Chen, Shih-Hung
;
Hellings, Geert
;
Linten, Dimitri
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1753
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Acq. date: 2025-12-15
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Metrics
Views
1753
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-15
Citations