Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs

dc.contributor.author	Cretu, B.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Routoure, J.M.
dc.contributor.author	Carin, R.
dc.contributor.author	Aoulaiche, Marc
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-22T18:46:11Z
dc.date.available	2021-10-22T18:46:11Z
dc.date.embargo	9999-12-31
dc.date.issued	2015
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/25110
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063817
dc.source.beginpage	237
dc.source.conference	Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS
dc.source.conferencedate	26/01/2015
dc.source.conferencelocation	Bologna Italy
dc.source.endpage	240
dc.title	Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs
dc.type	Proceedings paper
dspace.entity.type	Publication
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