Nanoscale localisation of an atom probe tip through electric field mapping

dc.contributor.author	Op de Beeck, Jonathan
dc.contributor.author	Fleischmann, Claudia
dc.contributor.author	Vandervorst, Wilfried
dc.contributor.author	Paredis, Kristof
dc.contributor.imecauthor	Op de Beeck, Jonathan
dc.contributor.imecauthor	Fleischmann, Claudia
dc.contributor.imecauthor	Vandervorst, Wilfried
dc.contributor.imecauthor	Paredis, Kristof
dc.contributor.orcidimec	Op de Beeck, Jonathan::0000-0003-3471-2156
dc.contributor.orcidimec	Fleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimec	Paredis, Kristof::0000-0002-5163-4164
dc.date.accessioned	2021-10-29T01:37:24Z
dc.date.available	2021-10-29T01:37:24Z
dc.date.issued	2020
dc.identifier.issn	1932-7447
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/35679
dc.identifier.url	https://doi.org/10.1021/acs.jpcc.9b10194
dc.source.beginpage	6371
dc.source.endpage	6378
dc.source.issue	11
dc.source.journal	Journal of Physical Chemistry C
dc.source.volume	124
dc.title	Nanoscale localisation of an atom probe tip through electric field mapping
dc.type	Journal article
dspace.entity.type	Publication
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