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Characterization of WF6/N2/H2 plasma enhanced chemical vapor deposited WxN films as barriers for Cu metallization
Publication:
Characterization of WF6/N2/H2 plasma enhanced chemical vapor deposited WxN films as barriers for Cu metallization
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Li, Hua
;
Jin, S.
;
Bender, Hugo
;
Lanckmans, Filip
;
Heyvaert, Ilse
;
Maex, Karen
;
Froyen, L.
Journal
J. Vacuum Science and Technology B
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1951
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1951
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations