Time dependent variability in RMG-HKMG FinFETs: impact of extraction scheme on stochastic NBTI

dc.contributor.author	Chaudhary, Ankush
dc.contributor.author	Kaczer, Ben
dc.contributor.author	Roussel, Philippe
dc.contributor.author	Chiarella, Thomas
dc.contributor.author	Horiguchi, Naoto
dc.contributor.author	Mahapatra, Souvik
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	Roussel, Philippe
dc.contributor.imecauthor	Chiarella, Thomas
dc.contributor.imecauthor	Horiguchi, Naoto
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimec	Roussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimec	Chiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimec	Horiguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned	2021-10-22T18:38:37Z
dc.date.available	2021-10-22T18:38:37Z
dc.date.embargo	9999-12-31
dc.date.issued	2015
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/25051
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112705
dc.source.beginpage	3B.4
dc.source.conference	IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate	19/04/2015
dc.source.conferencelocation	Monterey, CA USA
dc.title	Time dependent variability in RMG-HKMG FinFETs: impact of extraction scheme on stochastic NBTI
dc.type	Proceedings paper
dspace.entity.type	Publication
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