Publication:

Reducing front recombination losses to improve the efficiency of rear junction Cu-plated n-Si cells

Date

2014
Proceedings Paper
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dc.contributor.authorAleman, Monica
dc.contributor.authorUruena De Castro, Angel
dc.contributor.authorChoulat, Patrick
dc.contributor.authorHallam, Brett
dc.contributor.authorDang Thi Thuy, Chi
dc.contributor.authorRussell, Richard
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorSzlufcik, Jozef
dc.contributor.imecauthorAleman, Monica
dc.contributor.imecauthorChoulat, Patrick
dc.contributor.imecauthorDang Thi Thuy, Chi
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.date.accessioned2021-10-22T00:43:25Z
dc.date.available2021-10-22T00:43:25Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23485
dc.identifier.urlhttp://www.eupvsec-proceedings.com/proceedings?fulltext=aleman&paper=28014
dc.source.beginpage528
dc.source.conference29th European PV Solar Energy Conference and Exhibition and Exhibition - EUPVSEC
dc.source.conferencedate22/09/2014
dc.source.conferencelocationAmsterdam The Netherlands
dc.source.endpage531
dc.title

Reducing front recombination losses to improve the efficiency of rear junction Cu-plated n-Si cells

dc.typeProceedings paper
dspace.entity.typePublication
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