Publication:
Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1962 since deposited on 2021-10-15
Acq. date: 2026-05-18
Citations
Statistics
Views
1962 since deposited on 2021-10-15
Acq. date: 2026-05-18
Citations