Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Publication:
Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Date
2004
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
9155.pdf
423.39 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ghica, C.
;
Nistor, L.C.
;
Richard, Olivier
;
Bender, Hugo
;
Ulyashin, Aliaksandr
;
Van Tendeloo, G.
Journal
Abstract
Description
Metrics
Views
1960
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1960
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-08
Citations