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Saturation effects in TXRF on micro-droplet residue samples

Date

2004
Journal article
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dc.contributor.authorHellin, David
dc.contributor.authorFyen, Wim
dc.contributor.authorRip, Jens
dc.contributor.authorDelande, Tinne
dc.contributor.authorMertens, Paul
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorVinckier, Chris
dc.contributor.imecauthorHellin, David
dc.contributor.imecauthorRip, Jens
dc.contributor.imecauthorDelande, Tinne
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-15T13:45:46Z
dc.date.available2021-10-15T13:45:46Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9013
dc.source.beginpage1517
dc.source.endpage1523
dc.source.issue12
dc.source.journalJournal of Analytical Atomic Spectrometry
dc.source.volume19
dc.title

Saturation effects in TXRF on micro-droplet residue samples

dc.typeJournal article
dspace.entity.typePublication
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