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Impact of radiation on the operation and reliability of deep submicron CMOS technologies
Publication:
Impact of radiation on the operation and reliability of deep submicron CMOS technologies
Date
2010
Proceedings Paper
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20426.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Put, Sofie
;
Griffoni, Alessio
;
Cester, A.
;
Gerardin, S.
;
Meneghesso, G.
;
Paccagnella, A.
;
Simoen, Eddy
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Views
1937
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations
Metrics
Views
1937
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations