Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Publication:
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Copy permalink
Date
2020
Proceedings Paper
https://doi.org/10.1109/ITC44778.2020.9325258
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Lizhou
;
Rao, Siddharth
;
Taouil, Mottaqiallah
;
Marinissen, Erik Jan
;
Kar, Gouri Sankar
;
Hamdioui, Said
Journal
na
Abstract
Description
Metrics
Views
1900
since deposited on 2021-11-02
Acq. date: 2025-12-12
Citations
Metrics
Views
1900
since deposited on 2021-11-02
Acq. date: 2025-12-12
Citations