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An efficient bump pad design to mitigate the flip chip package induced stress

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dc.contributor.authorGonzalez, Mario
dc.contributor.authorDe Vos, Joeri
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorBeyne, Eric
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.imecauthorDe Vos, Joeri
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecDe Vos, Joeri::0000-0002-9332-9336
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.accessioned2021-10-22T19:27:07Z
dc.date.available2021-10-22T19:27:07Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25324
dc.source.beginpage1
dc.source.conferenceInterPACK & ICNNM
dc.source.conferencedate6/07/2015
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage7
dc.title

An efficient bump pad design to mitigate the flip chip package induced stress

dc.typeProceedings paper
dspace.entity.typePublication
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