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Single-wafer wet cleaning improved by novel high-performance wafer drying

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dc.contributor.authorMertens, Paul
dc.contributor.authorMarent, Katrien
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorMarent, Katrien
dc.date.accessioned2021-10-14T13:22:44Z
dc.date.available2021-10-14T13:22:44Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4581
dc.source.beginpage113
dc.source.issue9
dc.source.journalSolid State Technology
dc.source.volume43
dc.title

Single-wafer wet cleaning improved by novel high-performance wafer drying

dc.typeJournal article
dspace.entity.typePublication
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