Publication:
Advantages of high vacuum for electrical scanning probe microscopy
Date
| dc.contributor.author | Ludwig, Jonathan | |
| dc.contributor.author | Mascaro, Marco | |
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.author | van der Heide, Paul | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.author | Paredis, Kristof | |
| dc.contributor.imecauthor | Ludwig, Jonathan | |
| dc.contributor.imecauthor | Mascaro, Marco | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.imecauthor | van der Heide, Paul | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Paredis, Kristof | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.contributor.orcidimec | van der Heide, Paul::0000-0001-6292-0329 | |
| dc.contributor.orcidimec | Paredis, Kristof::0000-0002-5163-4164 | |
| dc.date.accessioned | 2021-10-27T13:01:05Z | |
| dc.date.available | 2021-10-27T13:01:05Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33481 | |
| dc.identifier.url | http://nanoscientific.org/?p=7111 | |
| dc.source.issue | Summer | |
| dc.source.journal | NanoScientific | |
| dc.title | Advantages of high vacuum for electrical scanning probe microscopy | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |