Publication:
Physics and reliability of SONOS and TANOS devices
Date
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-10-18T22:52:14Z | |
| dc.date.available | 2021-10-18T22:52:14Z | |
| dc.date.issued | 2010 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18156 | |
| dc.source.conference | International Memory Workshop, Tutorial on Charge Trap Memory | |
| dc.source.conferencedate | 16/05/2010 | |
| dc.source.conferencelocation | Seoul Korea | |
| dc.title | Physics and reliability of SONOS and TANOS devices | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |