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Conference contributions
Ab initio analysis of defect formation and dopant activation in P and As co-doped Si
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Ab initio analysis of defect formation and dopant activation in P and As co-doped Si
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nakazaki, Nobuya
;
Rosseel, Erik
;
Porret, Clément
;
Hikavyy, Andriy
;
Loo, Roger
;
Horiguchi, Naoto
;
Pourtois, Geoffrey
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2020
since deposited on 2021-10-27
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last month
2
last week
Acq. date: 2025-12-15
Citations
Metrics
Views
2020
since deposited on 2021-10-27
2
last month
2
last week
Acq. date: 2025-12-15
Citations