Publication:

Record performance top-down In0.53Ga0.47As vertical nanowire FETs and vertical nanosheets

Date

2017
Proceedings Paper
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dc.contributor.authorRamesh, Siva
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorAlian, AliReza
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCamerotto, Elisabeth
dc.contributor.authorMilenin, Alexey
dc.contributor.authorPinna, Nicolo
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorVeloso, Anabela
dc.contributor.authorLin, Dennis
dc.contributor.authorLagrain, Pieter
dc.contributor.authorFavia, Paola
dc.contributor.authorCollaert, Nadine
dc.contributor.authorDe Meyer, Kristin
dc.contributor.imecauthorRamesh, Siva
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorCamerotto, Elisabeth
dc.contributor.imecauthorMilenin, Alexey
dc.contributor.imecauthorPinna, Nicolo
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorLagrain, Pieter
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecRamesh, Siva::0000-0002-8473-7258
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecMilenin, Alexey::0000-0003-0747-0462
dc.contributor.orcidimecPinna, Nicolo::0000-0003-3392-0324
dc.contributor.orcidimecLagrain, Pieter::0000-0003-3734-7203
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-24T11:50:22Z
dc.date.available2021-10-24T11:50:22Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29263
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8268406/
dc.source.beginpage409
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate2/12/2017
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage412
dc.title

Record performance top-down In0.53Ga0.47As vertical nanowire FETs and vertical nanosheets

dc.typeProceedings paper
dspace.entity.typePublication
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