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In-situ characterization of mechanical properties of MEMS structural layers using different test approaches, with application to thick poly-SiGe
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In-situ characterization of mechanical properties of MEMS structural layers using different test approaches, with application to thick poly-SiGe
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Date
2011-09
Dissertation
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23498.pdf
4.65 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Barel, Greg
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Abstract
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1895
since deposited on 2021-10-19
Acq. date: 2025-12-15
Citations
Metrics
Views
1895
since deposited on 2021-10-19
Acq. date: 2025-12-15
Citations