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'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures
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'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures
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Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wang, Connie
;
Nauwelaers, Bart
;
De Raedt, Walter
;
Van Rossum, Marc
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Views
2242
since deposited on 2021-09-29
1
last month
1
last week
Acq. date: 2026-01-14
Citations