Publication:

Leveraging Artificial Intelligence and Reverse Tip Sample Configuration for Automation of Data Processing in Quantitative Scanning Spreading Resistance Microscopy

Date

2025
Journal article
https://doi.org/10.1002/pssa.202400688
Simple item page Full metadata Statistics
 
dc.contributor.authorWouters, Lennaert
dc.contributor.authorPeters, Kaylie
dc.contributor.authorLagrain, Pieter
dc.contributor.authorDrees, Ruben
dc.contributor.authorPeric, Nemanja
dc.contributor.authorHantschel, Thomas
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorPeters, Kaylie
dc.contributor.imecauthorLagrain, Pieter
dc.contributor.imecauthorPeric, Nemanja
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecLagrain, Pieter::0000-0003-3734-7203
dc.contributor.orcidimecPeric, Nemanja::0009-0005-1291-332X
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned2024-12-29T16:28:54Z
dc.date.available2024-12-29T16:28:54Z
dc.date.issued2025
dc.description.wosFundingTextThis work was done in the imec IIAP core CMOS programs. For the RTS SPM part, the authors acknowledge the provided support by Bruker Corporation in the framework of an imec-Bruker joint development project.
dc.identifier.doi10.1002/pssa.202400688
dc.identifier.issn1862-6300
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45022
dc.publisherWILEY-V C H VERLAG GMBH
dc.source.journalPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
dc.source.numberofpages9
dc.subject.keywordsIMAGE-ANALYSIS
dc.subject.keywordsNEURAL-NETWORKS
dc.title

Leveraging Artificial Intelligence and Reverse Tip Sample Configuration for Automation of Data Processing in Quantitative Scanning Spreading Resistance Microscopy

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles