Publication:
Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layer
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1912 since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations
Metrics
Views
1912 since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations