Publication:
Consistent model for short-channel NMOSFET after hard gate oxide breakdown
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | De Keersgieter, An | |
| dc.contributor.author | Van de Mieroop, Koen | |
| dc.contributor.author | Simons, Veerle | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | De Keersgieter, An | |
| dc.contributor.imecauthor | Simons, Veerle | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
| dc.contributor.orcidimec | Simons, Veerle::0000-0001-5714-955X | |
| dc.date.accessioned | 2021-10-14T21:58:48Z | |
| dc.date.available | 2021-10-14T21:58:48Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6460 | |
| dc.source.beginpage | 507 | |
| dc.source.endpage | 513 | |
| dc.source.issue | 3 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 49 | |
| dc.title | Consistent model for short-channel NMOSFET after hard gate oxide breakdown | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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