Publication:

Different types of positive charges generated near the oxide/Si interface

Date

2003
Presentation
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dc.contributor.authorZhang, C.Z.
dc.contributor.authorZhang, J.F.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.date.accessioned2021-10-15T07:57:23Z
dc.date.available2021-10-15T07:57:23Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8433
dc.source.conferenceSemiconductor Interfaxe Specialists Conference (SISC)
dc.source.conferencedate4/12/2003
dc.source.conferencelocationWashington USA
dc.title

Different types of positive charges generated near the oxide/Si interface

dc.typeOral presentation
dspace.entity.typePublication
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