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Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noise

Date

2010
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorPut, Sofie
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.authorKilchytska, Valeria
dc.contributor.authorAlvarado, Jose
dc.contributor.authorFlandre, Denis
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-18T21:37:31Z
dc.date.available2021-10-18T21:37:31Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17992
dc.source.beginpage43
dc.source.conferenceMicroelectronics Technology and Devices - SBMICRO 2010
dc.source.conferencedate6/09/2010
dc.source.conferencelocationSao Paulo Brazil
dc.source.endpage50
dc.title

Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noise

dc.typeProceedings paper
dspace.entity.typePublication
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