Publication:

First-principles-based screening method for resistivity scaling of anisotropic metals

Date

2022-12-23
Journal article
https://doi.org/10.1103/PhysRevMaterials.6.123804
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dc.contributor.authorMoors, Kristof
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorAdelmann, Christoph
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.orcidexthttps://orcid.org/0000-0002-8682-5286
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.date.accessioned2023-03-23T15:24:19Z
dc.date.available2023-01-18T03:17:48Z
dc.date.available2023-01-23T14:57:08Z
dc.date.available2023-03-23T15:24:19Z
dc.date.embargo9999-12-31
dc.date.issued2022-12-23
dc.description.wosFundingTextThis work has been supported by imec's industrial affiliate program on Nano-Interconnects. K.M. acknowledges the financial support by the Bavarian Ministry of Economic Affairs, Regional Development, and Energy within Bavaria's High -Tech Agenda Project "Bausteine fur das Quantencomputing auf Basis topologischer Materialien mit experimentellen und theoretischen Ansatzen" (Grant No. 07 02/686 58/1/21 1/22 2/23).
dc.identifier.doi10.1103/PhysRevMaterials.6.123804
dc.identifier.issn2475-9953
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40991
dc.publisherAMER PHYSICAL SOC
dc.source.beginpage123804-1
dc.source.endpage123804-10
dc.source.issue12
dc.source.journalPHYSICAL REVIEW MATERIALS
dc.source.numberofpages10
dc.source.volume6
dc.subject.keywordsPOLYCRYSTALLINE FILMS
dc.subject.keywordsINTERCONNECTS
dc.subject.keywordsREFLECTION
dc.subject.keywordsMODEL
dc.title

First-principles-based screening method for resistivity scaling of anisotropic metals

dc.typeJournal article
dspace.entity.typePublication
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