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Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Publication:
Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents
Date
2009-02
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martin-Martinez, Javier
;
Kaczer, Ben
;
Boix, J.
;
Ayala, N.
;
Rodriguez, Rosana
;
Nafria, Montserrat
;
Aymerich, X.
;
Zuber, Paul
;
Dierickx, Bart
;
Groeseneken, Guido
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1896
since deposited on 2021-10-18
Acq. date: 2025-12-08
Citations
Metrics
Views
1896
since deposited on 2021-10-18
Acq. date: 2025-12-08
Citations