Publication:
Transient thermometry and HRTEM analysis of RRAM thermal dynamics during switching and failure
Date
| dc.contributor.author | Kwon, J. | |
| dc.contributor.author | Sharma, A.A. | |
| dc.contributor.author | Chen, C. | |
| dc.contributor.author | Fantini, Andrea | |
| dc.contributor.author | Jurczak, Gosia | |
| dc.contributor.author | Bain, J. | |
| dc.contributor.author | Picard, Y. | |
| dc.contributor.author | Skowronski, Marek | |
| dc.contributor.imecauthor | Fantini, Andrea | |
| dc.contributor.imecauthor | Jurczak, Gosia | |
| dc.date.accessioned | 2021-10-23T11:59:38Z | |
| dc.date.available | 2021-10-23T11:59:38Z | |
| dc.date.issued | 2016 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26866 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/7574579 | |
| dc.source.conference | 2016 IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | 2/04/2016 | |
| dc.source.conferencelocation | Pasadena, CA USA | |
| dc.title | Transient thermometry and HRTEM analysis of RRAM thermal dynamics during switching and failure | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |