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ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications
Publication:
ESD Failures of GaN-on-Si D-Mode AlGaN/GaN MIS-HEMT and HEMT Devices for 5G Telecommunications
Date
2021
Proceedings Paper
https://doi.org/10.23919/EOS/ESD52038.2021.9574716
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Wei-Min
;
Chen, Shih-Hung
;
Putcha, Vamsi
;
Peralagu, Uthayasankaran
;
Sibaja-Hernandez, Arturo
;
Yadav, Sachin
;
Parvais, Bertrand
;
Alian, AliReza
;
Collaert, Nadine
;
Ker, Ming-Dou
;
Groeseneken, Guido
Journal
na
Abstract
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1379
since deposited on 2022-05-05
Acq. date: 2025-10-26
Citations
Metrics
Views
1379
since deposited on 2022-05-05
Acq. date: 2025-10-26
Citations