Publication:
On characterization of etch processes in TCP reactor with PlasmaVolt X2 sensor wafer
Date
| dc.contributor.author | Milenin, Alexey | |
| dc.contributor.author | de Marneffe, Jean-Francois | |
| dc.contributor.author | Struyf, Herbert | |
| dc.contributor.author | Boullart, Werner | |
| dc.contributor.author | Arleo, Paul | |
| dc.contributor.imecauthor | Milenin, Alexey | |
| dc.contributor.imecauthor | de Marneffe, Jean-Francois | |
| dc.contributor.imecauthor | Struyf, Herbert | |
| dc.contributor.imecauthor | Boullart, Werner | |
| dc.contributor.orcidimec | Milenin, Alexey::0000-0003-0747-0462 | |
| dc.contributor.orcidimec | Boullart, Werner::0000-0001-7614-2097 | |
| dc.date.accessioned | 2021-10-18T19:07:47Z | |
| dc.date.available | 2021-10-18T19:07:47Z | |
| dc.date.issued | 2010 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17629 | |
| dc.identifier.url | https://imec-events.be/UserFiles/76/File/Presentations/Posters/PESM_2010_poster_Milenin.jpg | |
| dc.source.conference | 3rd International Plasma Etch and Strip in Microelectronics Workshop - PESM | |
| dc.source.conferencedate | 4/03/2010 | |
| dc.source.conferencelocation | Grenoble France | |
| dc.title | On characterization of etch processes in TCP reactor with PlasmaVolt X2 sensor wafer | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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