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Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memories
Publication:
Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memories
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Suhane, Amit
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Breuil, Laurent
;
Cacciato, Antonio
;
Rothschild, Aude
;
Jurczak, Gosia
;
Van Houdt, Jan
;
De Meyer, Kristin
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1976
since deposited on 2021-10-18
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1
last week
Acq. date: 2025-12-10
Citations
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Views
1976
since deposited on 2021-10-18
2
last month
1
last week
Acq. date: 2025-12-10
Citations