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At tape-out: can yield in terms of parametric specifications be predicted?
Publication:
At tape-out: can yield in terms of parametric specifications be predicted?
Date
2007-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Papanikolaou, Antonis
;
Miranda Corbalan, Miguel
;
Marchal, Pol
;
Dierickx, Bart
;
Catthoor, Francky
Journal
Abstract
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1944
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1944
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations