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The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Publication:
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Date
2009
Meeting abstract
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19746.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Crupi, F.
;
Magnone, P.
;
Simoen, Eddy
;
Pantisano, Luigi
;
Giusi, G.
;
Pace, C.
;
Claeys, Cor
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1928
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1928
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations