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Articles
Robust optimization of test-access architectures under realistic scenarios
Publication:
Robust optimization of test-access architectures under realistic scenarios
Date
2015-11
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deutsch, Sergej
;
Chakrabarty, Krishnendu
;
Marinissen, Erik Jan
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
Abstract
Description
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1932
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1932
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations